Mapping optical and photoactive films requires comparing transmission, conductivity, bandgap, stability, phase, roughness, absorption, and process compatibility in the same material space.
Creating thin-film libraries with controlled composition or process variation, then measuring composition, XRD phase, optical response, electrical response, morphology, and selected surface behavior.
Transparent conductor libraries; absorber films; optical mapping; electrical mapping; XRD; photoelectrochemical follow-up where scoped.
Film regions are selected for transparent conductor tests, absorber follow-up, optical coating stacks, or photoelectrochemical validation. Broad tradeoff questions become measured candidate sets.